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Transport current measurements in superconducting tapes and wires can be performed in fields up to 13 T at 4.2 K. The superconducting spit bore magnet used to provide the background field for these measurements will be integrated with the existing materials test system allowing simultaneous application of monotonic or cyclic mechanical stresses to samples. Precision power supplies up to 1 kA are available for critical current measurements of wires and tapes. A wide range of data acquisition devices are available.
The split pair magnet-materials test system can also be configured for tests of large scale conductors. Samples as large as 20 x 25 mm can be accommodated in the split bore magnet. The materials test system can apply forces up to 500 kN and, being located near the main d.c. power supplies, currents as large as 40 kA can be delivered to test specimens.
A second materials test system is available for testing of structural metals and composites. The system incorporates an overhead actuator, liquid helium cryostat and variable temperature grips to enable testing in liquid at 4.2 and 77 K or testing in gas at other temperatures between 4.2 and 300 K. Control of the system is fully digital, allowing construction of complicated loading sequences. A number of cryogenic transducers are available for instrumentation of test specimens and digital data acquisition allows high rate data taking and analysis.
A third materials test system is being installed. This system is integrated with a large bore split solenoid magnet with a peak field of about 14 T. This system, being located near the main d.c. power supplies, will allow testing of large superconductors with currents of up to 10 kA with the simultaneous application of mechanical forces up to 250 kN. The addition of large vapor cooled leads would allow operation to 80 kA, the maximum rated current of the d.c. power supplies. Samples as large as 30 x 70 mm can be accomodated.
The Environmental Scanning Electron Microscope allows imaging in pressures up to 50 torr in an atmosphere selected by the user. A stage that heats the specimen to 1000 oC is available. Backscattered Kikuchi Diffractometry allows the determination of single crystal orientation and orientation of individual grains in polycrystalline materials with grain sizes larger than ~ 2 micrometers.
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